The aim of this project is the development of a novel characterization method for new types of clinker using X-ray Powder Diffraction (XRD) Rietveld analysis and Scanning Electron Microscopy (SEM), Backscattered imaging as well as Energy Dispersive Spectroscopy mapping. The acquired data from those analyses will be combined providing a more precise and faster phase-quantification and characterization of clinker. The first objective of the project was the standardization of the sampling and sample preparation process. Towards this direction, a series of different sample preparation techniques for scanning electron microscopy and X-ray powder diffraction measurement have been performed revealing processes that minimize measurement artifacts. With the completion of the sample preparation standardization, highaccuracy measurement of the beam-current have been performed to calibrate the scanning electron microscope to ensure the repeatability of the measurements. In addition, comparison of multiple XRD devices measurements was performed. A series of Rietveld analysis software were also tested. Quantification of the amorphous phases was also achieved with an internal standard method. Additional information for clinker analysis was provided with X-ray fluorescent analysis of the samples. The current status of the project is the development of a pixel-wise segmentation method for the backscattered images for clinker samples providing a course phase quantification. Finally, an optimization of the scanning electron backscattered image acquisition parameters is studied in order to maximize the information obtained and standardize the backscattered imaging process.