Zisis Grigoris – Konstantinos

Accurate thickness and refractive index mapping of 2D materials by reflectance spectroscopy and imaging techniques (SLICE)

Graphene and other two-dimensional (2D) materials are currently subjects of intense research interest all over the world, due to their unique physical properties that are expected to revolutionize a number of fields, such as electronics, photonics, and plasmonics. To enable commercialization of such materials, accurate non-destructive surface monitoring and characterization is required in order to standardize a reliable mass production process.
The core objective of the SLICE project is the development of a radical optical approach for precise characterization of 2D materials (e.g. graphene, graphene oxide, fluorographene, 2D chalcogenides and heterostructures), in terms of number-of-layers and refractive index, in order to facilitate and speed up their implementation in novel industrial applications.

The specific technical objectives of the project are:

a) To provide a simple yet powerful surface analytical technique based on reflectance spectroscopy in a broad wavelength range (UV-Vis-NIR) and a variation of optical reflection microscopy.
b) The development and validation of measuring and modelling tools to correlate the structural and optical characteristics of 2D materials in industrially relevant environments.

Through the project and the collaboration with NCSR ‘Demokritos’ groups, the company will penetrate further in the Global Thin-film Metrology Systems market increasing both the profit of the company and the related workforce.